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TEST
Test and dEpendability of microelectronic integrated SysTems
Consult your copyright
Titre du journal ou ISSN
Editeur
Number of Files
172
Nomber of Notices
288
Collaborations’ map
Tags
Simulation
Test efficiency
One bit acquisition
Security
Fault attacks
Approximate computing
Fault injection
Alternate testing
Power consumption
OQPSK
COTS
Radiation
Flip-flops
Soft errors
Transistors
BIST
Circuit faults
Analytical models
Through-silicon vias
Context Saving
Test and Security
Diagnosis
ATPG
Radiation hardening
Microprocessor chips
Reliability
Logic testing
Random access memory
Cross section
SER
ZigBee
Diffusion model
Machine-learning algorithms
RF integrated circuits
1-bit acquisition
Heavy ions
Memories
Stream Cipher
Fiabilité
3D integration
Integrated circuit testing
Hardware
Clocks
Fault tolerance
Hardware Security
Laser
Machine Learning
Indirect testing
Estimation
Logic gates
Hardware Trojan
Particle detector
Single event upset SEU
Digital signal processing
Integrated circuits
Software
Atmospheric neutrons
Integrated circuit design
Libraries
Analog/RF integrated circuits
Fault tolerant systems
Monitoring
Fault Injection
Integrated circuit reliability
Integrated circuit modeling
Soft error
Combinational circuits
Computational modeling
Hardware security
Power supplies
Approximate Computing
Ensemble methods
Digital ATE
Fault simulation
SRAM
Neutrons
Test
Multiple cell upset MCU
Phase noise
Automatic test pattern generation
Scan Attacks Countermeasure
FDSOI
RF test
Switches
Delays
Protons
JTAG
Transient faults
Analog signals
Education
Test cost reduction
Computer architecture
SEU
Power demand
Process variability
Microprocessors
Testing
Scan Encryption
Noise measurement
Transient analysis