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 Test and dEpendability of microelectronic integrated SysTems

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Phase noise Soft errors Fault Injection Atmospheric neutrons Education Hardware security Computational modeling SER Alternate testing Neutrons Digital signal processing Ensemble methods Scan Attacks Countermeasure Protons Integrated circuit testing Test Microprocessor chips Hardware Trojan Analytical models Simulation Transient faults Soft error Transient analysis Integrated circuit design Analog/RF integrated circuits Security Transistors Particle detector Power supplies Combinational circuits Hardware Fault attacks RF test Automatic test pattern generation ZigBee Machine Learning 3D integration SRAM Power demand Analog signals Diffusion model Laser COTS Context Saving Diagnosis JTAG Clocks Logic gates Reliability Radiation hardening Libraries Logic testing Delays Fault injection Stream Cipher Indirect testing Test cost reduction Fiabilité SEU Fault tolerant systems Single event upset SEU Estimation Memories Machine-learning algorithms Noise measurement Monitoring Test and Security Cross section ATPG Approximate computing Circuit faults Power consumption Heavy ions OQPSK Radiation BIST Digital ATE Fault tolerance Flip-flops Scan Encryption Software Through-silicon vias Switches Process variability One bit acquisition Integrated circuits FDSOI Approximate Computing Test efficiency 1-bit acquisition Computer architecture Random access memory Hardware Security Fault simulation Integrated circuit reliability Microprocessors RF integrated circuits Testing Integrated circuit modeling Multiple cell upset MCU