Atmospheric neutrons Microprocessors One bit acquisition Education SER Simulation Noise measurement Neutrons Microprocessor chips Protons Fault Injection Estimation SRAM Stream Cipher Fault simulation Switches Fault tolerance Digital signal processing Fault Tolerance RF test Power demand SEU Radiation Digital ATE RF integrated circuits Libraries Radiation hardening Diagnosis Power supplies OQPSK Approximate computing Software Single event upset SEU Scan Attacks Countermeasure Random access memory Test FRAM Memories RISC-V Integrated circuit modeling IoT Test and Security Neutron Test efficiency BIST Integrated circuits Transient analysis Logic testing Flip-flops Cross section Hardware Security Fault injection Multiple cell upset MCU Computer architecture Dynamic test ZigBee Phase noise Transistors Integrated circuit reliability Particle detector Indirect testing Integrated circuit testing Hardware Test cost reduction Power consumption Fault attacks Laser 1-bit acquisition Silicon Analog/RF integrated circuits Machine Learning Analog signals Indirect test Soft errors Reliability Process variability JTAG Diffusion model Approximate Computing Fault tolerant systems Logic gates Security Monitoring Fiabilité Integrated circuit design Circuit faults Hardware Trojan Automatic test pattern generation Ensemble methods FDSOI Clocks Soft error Machine-learning algorithms Hardware security ATPG Latch design Testing Radiation effects Heavy ions Delays