Simulation Test efficiency One bit acquisition Security Fault attacks Approximate computing Fault injection Alternate testing Power consumption OQPSK COTS Radiation Flip-flops Soft errors Transistors BIST Circuit faults Analytical models Through-silicon vias Context Saving Test and Security Diagnosis ATPG Radiation hardening Microprocessor chips Reliability Logic testing Random access memory Cross section SER ZigBee Diffusion model Machine-learning algorithms RF integrated circuits 1-bit acquisition Heavy ions Memories Stream Cipher Fiabilité 3D integration Integrated circuit testing Hardware Clocks Fault tolerance Hardware Security Laser Machine Learning Indirect testing Estimation Logic gates Hardware Trojan Particle detector Single event upset SEU Digital signal processing Integrated circuits Software Atmospheric neutrons Integrated circuit design Libraries Analog/RF integrated circuits Fault tolerant systems Monitoring Fault Injection Integrated circuit reliability Integrated circuit modeling Soft error Combinational circuits Computational modeling Hardware security Power supplies Approximate Computing Ensemble methods Digital ATE Fault simulation SRAM Neutrons Test Multiple cell upset MCU Phase noise Automatic test pattern generation Scan Attacks Countermeasure FDSOI RF test Switches Delays Protons JTAG Transient faults Analog signals Education Test cost reduction Computer architecture SEU Power demand Process variability Microprocessors Testing Scan Encryption Noise measurement Transient analysis