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TEST
Test and dEpendability of microelectronic integrated SysTems
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Contains
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Number of Files
167
Nomber of Notices
285
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Tags
Phase noise
Soft errors
Fault Injection
Atmospheric neutrons
Education
Hardware security
Computational modeling
SER
Alternate testing
Neutrons
Digital signal processing
Ensemble methods
Scan Attacks Countermeasure
Protons
Integrated circuit testing
Test
Microprocessor chips
Hardware Trojan
Analytical models
Simulation
Transient faults
Soft error
Transient analysis
Integrated circuit design
Analog/RF integrated circuits
Security
Transistors
Particle detector
Power supplies
Combinational circuits
Hardware
Fault attacks
RF test
Automatic test pattern generation
ZigBee
Machine Learning
3D integration
SRAM
Power demand
Analog signals
Diffusion model
Laser
COTS
Context Saving
Diagnosis
JTAG
Clocks
Logic gates
Reliability
Radiation hardening
Libraries
Logic testing
Delays
Fault injection
Stream Cipher
Indirect testing
Test cost reduction
Fiabilité
SEU
Fault tolerant systems
Single event upset SEU
Estimation
Memories
Machine-learning algorithms
Noise measurement
Monitoring
Test and Security
Cross section
ATPG
Approximate computing
Circuit faults
Power consumption
Heavy ions
OQPSK
Radiation
BIST
Digital ATE
Fault tolerance
Flip-flops
Scan Encryption
Software
Through-silicon vias
Switches
Process variability
One bit acquisition
Integrated circuits
FDSOI
Approximate Computing
Test efficiency
1-bit acquisition
Computer architecture
Random access memory
Hardware Security
Fault simulation
Integrated circuit reliability
Microprocessors
RF integrated circuits
Testing
Integrated circuit modeling
Multiple cell upset MCU