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 Test and dEpendability of microelectronic integrated SysTems

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Hardware Security Silicon Hardware OQPSK Stream Cipher Test and Security Scan Encryption Fault tolerance Delays Power supplies Reliability Computer architecture Fiabilité 1-bit acquisition 3D integration Fault injection One bit acquisition Integrated circuit testing COTS Monitoring Integrated circuit design Approximate computing Fault simulation Analog signals Soft errors Libraries Heavy ions Testing Automatic test pattern generation Clocks Analog/RF integrated circuits SER Diagnosis Soft error Multiple cell upset MCU Ensemble methods Transistors Test Integrated circuit reliability Digital ATE Indirect testing Transient faults Logic testing SRAM Neutrons Hardware security BIST Logic gates ATPG Laser Noise measurement Test efficiency Diffusion model Power demand Fault Injection Software Estimation Radiation RF test Education Microprocessor chips Computational modeling Particle detector Through-silicon vias Approximate Computing Integrated circuits Microprocessors SEU Circuit faults Phase noise RF integrated circuits Cross section Transient analysis Alternate testing Radiation hardening Scan Attacks Countermeasure Fault tolerant systems Combinational circuits Hardware Trojan ZigBee Test cost reduction Simulation FDSOI Memories JTAG Integrated circuit modeling Process variability Protons Analytical models Digital signal processing Fault attacks Atmospheric neutrons Switches Flip-flops Machine-learning algorithms Machine Learning Power consumption Random access memory Single event upset SEU Security