Fitting ATE Channels with Scan Chains: A Comparison Between a Test Data Compression Technique and Serial Loading of Scan Chains

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DELTA'06: Third IEEE International Workshop on Electronics DesignTest & Applications, Kuala Lumpur (Malaysia), IEEE, pp.295-300, 2006
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00102704
Contributeur : Christine Carvalho de Matos <>
Soumis le : lundi 2 octobre 2006 - 15:41:21
Dernière modification le : jeudi 24 mai 2018 - 15:59:24

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  • HAL Id : lirmm-00102704, version 1

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Julien Dalmasso, Marie-Lise Flottes, Bruno Rouzeyre. Fitting ATE Channels with Scan Chains: A Comparison Between a Test Data Compression Technique and Serial Loading of Scan Chains. DELTA'06: Third IEEE International Workshop on Electronics DesignTest & Applications, Kuala Lumpur (Malaysia), IEEE, pp.295-300, 2006. 〈lirmm-00102704〉

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