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Conference papers

Fitting ATE Channels with Scan Chains: A Comparison Between a Test Data Compression Technique and Serial Loading of Scan Chains

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00102704
Contributor : Christine Carvalho de Matos Connect in order to contact the contributor
Submitted on : Monday, October 2, 2006 - 3:41:21 PM
Last modification on : Tuesday, October 23, 2018 - 10:46:02 AM

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  • HAL Id : lirmm-00102704, version 1

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Julien Dalmasso, Marie-Lise Flottes, Bruno Rouzeyre. Fitting ATE Channels with Scan Chains: A Comparison Between a Test Data Compression Technique and Serial Loading of Scan Chains. DELTA'06: Third IEEE International Workshop on Electronics DesignTest & Applications, Kuala Lumpur (Malaysia), pp.295-300. ⟨lirmm-00102704⟩

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