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On the Testing of the Electronic Conditioning Chain of a CMOS MEMS Based Magnetic Field Sensor

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00102750
Contributor : Christine Carvalho de Matos <>
Submitted on : Monday, October 2, 2006 - 4:05:30 PM
Last modification on : Thursday, May 24, 2018 - 3:59:24 PM

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  • HAL Id : lirmm-00102750, version 1

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Olivier Leman, Florence Azaïs, Laurent Latorre, Frédérick Mailly, Pascal Nouet. On the Testing of the Electronic Conditioning Chain of a CMOS MEMS Based Magnetic Field Sensor. LATW'06: 7th IEEE Latin American Test Workshop, Mar 2006, Buenos Aires, Argentina. pp.29-34. ⟨lirmm-00102750⟩

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