On the Testing of the Electronic Conditioning Chain of a CMOS MEMS Based Magnetic Field Sensor - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2006

On the Testing of the Electronic Conditioning Chain of a CMOS MEMS Based Magnetic Field Sensor

Christine Carvalho De Matos  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00102750

Submitted on : Monday, October 2, 2006-4:05:30 PM

Last modification on : Friday, March 24, 2023-2:52:48 PM

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lirmm-00102750 , version 1 (02-10-2006)

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  • HAL Id : lirmm-00102750 , version 1

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Olivier Leman, Florence Azaïs, Laurent Latorre, Frédérick Mailly, Pascal Nouet. On the Testing of the Electronic Conditioning Chain of a CMOS MEMS Based Magnetic Field Sensor. LATW'06: 7th IEEE Latin American Test Workshop, Mar 2006, Buenos Aires, Argentina. pp.29-34. ⟨lirmm-00102750⟩

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