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Low Power Scan Chain Design: A Solution for an Efficient Tradeoff Between Test Power and Scan Routing

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00105357
Contributor : Christine Carvalho De Matos Connect in order to contact the contributor
Submitted on : Wednesday, October 11, 2006 - 7:51:31 AM
Last modification on : Friday, August 5, 2022 - 10:47:52 AM

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  • HAL Id : lirmm-00105357, version 1

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Patrick Girard, Yannick Bonhomme. Low Power Scan Chain Design: A Solution for an Efficient Tradeoff Between Test Power and Scan Routing. Journal of Low Power Electronics, American Scientific Publishers, 2005, 1 (1), pp.85-95. ⟨lirmm-00105357⟩

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