Low Power Scan Chain Design: A Solution for an Efficient Tradeoff Between Test Power and Scan Routing - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Journal Articles Journal of Low Power Electronics Year : 2005
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lirmm-00105357 , version 1 (11-10-2006)

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Patrick Girard, Yannick Bonhomme. Low Power Scan Chain Design: A Solution for an Efficient Tradeoff Between Test Power and Scan Routing. Journal of Low Power Electronics, 2005, 1 (1), pp.85-95. ⟨10.1166/jolpe.2005.004⟩. ⟨lirmm-00105357⟩
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