Journal Articles Journal of Low Power Electronics Year : 2005

Low Power Scan Chain Design: A Solution for an Efficient Tradeoff Between Test Power and Scan Routing

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Computer Science [cs]

Christine Carvalho De Matos  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00105357

Submitted on : Wednesday, October 11, 2006-7:51:31 AM

Last modification on : Wednesday, January 8, 2025-11:18:09 AM

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lirmm-00105357 , version 1 (11-10-2006)

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Patrick Girard, Yannick Bonhomme. Low Power Scan Chain Design: A Solution for an Efficient Tradeoff Between Test Power and Scan Routing. Journal of Low Power Electronics, 2005, 1 (1), pp.85-95. ⟨10.1166/jolpe.2005.004⟩. ⟨lirmm-00105357⟩

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