Electrical Behavior of GOS Faults in Domino Logic - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2005
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lirmm-00105991 , version 1 (13-10-2006)

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  • HAL Id : lirmm-00105991 , version 1

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Mariane Comte, Satoshi Ohtake, Hideo Fujiwara, Michel Renovell. Electrical Behavior of GOS Faults in Domino Logic. DDECS'05: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, Apr 2005, Sopron, Hungary, pp.210-215. ⟨lirmm-00105991⟩
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