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Electrical Behavior of GOS Faults in Domino Logic

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00105991
Contributor : Christine Carvalho de Matos <>
Submitted on : Friday, October 13, 2006 - 10:22:44 AM
Last modification on : Friday, July 20, 2018 - 12:34:01 PM

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  • HAL Id : lirmm-00105991, version 1

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Mariane Comte, Satoshi Ohtake, Hideo Fujiwara, Michel Renovell. Electrical Behavior of GOS Faults in Domino Logic. DDECS'05: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, Apr 2005, Sopron, Hungary, pp.210-215. ⟨lirmm-00105991⟩

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