Electro-Thermal On-Line Testing of a MEMS Magnetometer Through Bias Modulation - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2005

Electro-Thermal On-Line Testing of a MEMS Magnetometer Through Bias Modulation

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Micro and nanotechnologies/Microelectronics

Christine Carvalho De Matos  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00106517

Submitted on : Monday, October 16, 2006-8:38:42 AM

Last modification on : Friday, March 24, 2023-2:52:48 PM

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lirmm-00106517 , version 1 (16-10-2006)

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  • HAL Id : lirmm-00106517 , version 1

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Frédérick Mailly, Norbert Dumas, Laurent Latorre, Florence Azaïs, Pascal Nouet. Electro-Thermal On-Line Testing of a MEMS Magnetometer Through Bias Modulation. LATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.213-218. ⟨lirmm-00106517⟩

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