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Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure

Florence Azaïs 1 Serge Bernard 1 Yves Bertrand 1 Mariane Comte 1 Michel Renovell 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108545
Contributor : Christine Carvalho de Matos <>
Submitted on : Monday, October 23, 2006 - 7:43:08 AM
Last modification on : Tuesday, January 5, 2021 - 4:00:04 PM
Long-term archiving on: : Tuesday, April 6, 2010 - 8:27:19 PM

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  • HAL Id : lirmm-00108545, version 1

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CNRS | SYSMIC | LIRMM | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER

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Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell. Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure. Journal of Electronic Testing, Springer Verlag, 2004, 20 (4), pp.375-387. ⟨lirmm-00108545⟩

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