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Journal Articles Microelectronics Reliability Year : 2004

Automated Diagnosis and Probing Flow for Fast Fault Localization in IC

Da. Martin
  • Function : Author
Romain Desplats
  • Function : Author
Gérard Haller
  • Function : Author

Abstract

Automated Diagnosis and Probing Flow for Fast Fault Localization in IC
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lirmm-00108546 , version 1 (23-10-2006)

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Da. Martin, Romain Desplats, Gérard Haller, Florence Azaïs, Pascal Nouet. Automated Diagnosis and Probing Flow for Fast Fault Localization in IC. Microelectronics Reliability, 2004, 44 (9/11), pp.1553-1558. ⟨10.1016/j.microrel.2004.07.057⟩. ⟨lirmm-00108546⟩
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