Automated Diagnosis and Probing Flow for Fast Fault Localization in IC
Abstract
Automated Diagnosis and Probing Flow for Fast Fault Localization in IC
Journal Articles
Microelectronics Reliability
Year : 2004
Christine Carvalho De Matos : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108546
Submitted on : Monday, October 23, 2006-7:43:09 AM
Last modification on : Wednesday, August 2, 2023-4:40:25 PM
Long-term archiving on : Tuesday, April 6, 2010-8:27:29 PM
Dates and versions
Identifiers
- HAL Id : lirmm-00108546 , version 1
- DOI : 10.1016/j.microrel.2004.07.057
Cite
Da. Martin, Romain Desplats, Gérard Haller, Florence Azaïs, Pascal Nouet. Automated Diagnosis and Probing Flow for Fast Fault Localization in IC. Microelectronics Reliability, 2004, 44 (9/11), pp.1553-1558. ⟨10.1016/j.microrel.2004.07.057⟩. ⟨lirmm-00108546⟩
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