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Automated Diagnosis and Probing Flow for Fast Fault Localization in IC

Da. Martin Romain Desplats Gérard Haller Florence Azaïs 1 Pascal Nouet 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : Automated Diagnosis and Probing Flow for Fast Fault Localization in IC
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108546
Contributor : Christine Carvalho de Matos <>
Submitted on : Monday, October 23, 2006 - 7:43:09 AM
Last modification on : Thursday, May 24, 2018 - 3:59:24 PM
Long-term archiving on: : Tuesday, April 6, 2010 - 8:27:29 PM

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Da. Martin, Romain Desplats, Gérard Haller, Florence Azaïs, Pascal Nouet. Automated Diagnosis and Probing Flow for Fast Fault Localization in IC. Microelectronics Reliability, Elsevier, 2004, 44 (9/11), pp.1553-1558. ⟨lirmm-00108546⟩

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