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The Pros and Cons of Very-Low-Voltage Testing: An Analysis Based on Resistive Bridging Faults

P. Engelke I. Polian Michel Renovell 1 B. Seshadri P. Becker
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108660
Contributor : Christine Carvalho de Matos <>
Submitted on : Monday, October 23, 2006 - 8:52:41 AM
Last modification on : Friday, July 20, 2018 - 12:34:01 PM

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  • HAL Id : lirmm-00108660, version 1

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P. Engelke, I. Polian, Michel Renovell, B. Seshadri, P. Becker. The Pros and Cons of Very-Low-Voltage Testing: An Analysis Based on Resistive Bridging Faults. GI/ITG Workshop Testmethoden und Zuverlassigkeit von Schaltungen und Systemen, Feb 2004, Dresden, Germany. pp.149-153. ⟨lirmm-00108660⟩

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