The Pros and Cons of Very-Low-Voltage Testing: An Analysis Based on Resistive Bridging Faults - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2004

The Pros and Cons of Very-Low-Voltage Testing: An Analysis Based on Resistive Bridging Faults

P. Engelke
  • Function : Author
I. Polian
  • Function : Author
B. Seshadri
  • Function : Author
P. Becker
  • Function : Author
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lirmm-00108660 , version 1 (23-10-2006)

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  • HAL Id : lirmm-00108660 , version 1

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P. Engelke, I. Polian, Michel Renovell, B. Seshadri, P. Becker. The Pros and Cons of Very-Low-Voltage Testing: An Analysis Based on Resistive Bridging Faults. GI/ITG Workshop Testmethoden und Zuverlassigkeit von Schaltungen und Systemen, Feb 2004, Dresden, Germany. pp.149-153. ⟨lirmm-00108660⟩
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