The Pros and Cons of Very-Low-Voltage Testing: An Analysis Based on Resistive Bridging Faults - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2004

The Pros and Cons of Very-Low-Voltage Testing: An Analysis Based on Resistive Bridging Faults

P. Engelke
  • Function : Author
I. Polian
  • Function : Author
Michel Renovell
Conception et Test de Systèmes MICroélectroniques
CV
B. Seshadri
  • Function : Author
P. Becker
  • Function : Author

Domains

Micro and nanotechnologies/Microelectronics

Christine Carvalho De Matos  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108660

Submitted on : Monday, October 23, 2006-8:52:41 AM

Last modification on : Friday, March 24, 2023-2:52:48 PM

No file

Dates and versions

lirmm-00108660 , version 1 (23-10-2006)

Identifiers

  • HAL Id : lirmm-00108660 , version 1

Cite

P. Engelke, I. Polian, Michel Renovell, B. Seshadri, P. Becker. The Pros and Cons of Very-Low-Voltage Testing: An Analysis Based on Resistive Bridging Faults. GI/ITG Workshop Testmethoden und Zuverlassigkeit von Schaltungen und Systemen, Feb 2004, Dresden, Germany. pp.149-153. ⟨lirmm-00108660⟩

Export

BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite

Collections

CNRS SYSMIC LIRMM LIRMM_MIC MIC MIPS UNIV-MONTPELLIER
53 View
0 Download

Share

More