Conference Papers
Year : 2004
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108660
Submitted on : Monday, October 23, 2006-8:52:41 AM
Last modification on : Friday, March 24, 2023-2:52:48 PM
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- HAL Id : lirmm-00108660 , version 1
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P. Engelke, I. Polian, Michel Renovell, B. Seshadri, P. Becker. The Pros and Cons of Very-Low-Voltage Testing: An Analysis Based on Resistive Bridging Faults. GI/ITG Workshop Testmethoden und Zuverlassigkeit von Schaltungen und Systemen, Feb 2004, Dresden, Germany. pp.149-153. ⟨lirmm-00108660⟩
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