Automatic Test Pattern Generation for Resistive Bridging Faults - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2004

Automatic Test Pattern Generation for Resistive Bridging Faults

P. Engelke
  • Function : Author
I. Polian
  • Function : Author
Michel Renovell
Conception et Test de Systèmes MICroélectroniques
CV
P. Becker
  • Function : Author

Domains

Micro and nanotechnologies/Microelectronics

Christine Carvalho De Matos  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108661

Submitted on : Monday, October 23, 2006-8:52:41 AM

Last modification on : Friday, March 24, 2023-2:52:48 PM

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lirmm-00108661 , version 1 (23-10-2006)

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  • HAL Id : lirmm-00108661 , version 1

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P. Engelke, I. Polian, Michel Renovell, P. Becker. Automatic Test Pattern Generation for Resistive Bridging Faults. IEEE International Workshop on Current and Defect-Based Testing, May 2004, Napa Valley, CA, pp.89-94. ⟨lirmm-00108661⟩

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