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Conference Papers Year : 2004

Automatic Test Pattern Generation for Resistive Bridging Faults

P. Engelke
  • Function : Author
I. Polian
  • Function : Author
P. Becker
  • Function : Author
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Dates and versions

lirmm-00108661 , version 1 (23-10-2006)

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  • HAL Id : lirmm-00108661 , version 1

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P. Engelke, I. Polian, Michel Renovell, P. Becker. Automatic Test Pattern Generation for Resistive Bridging Faults. IEEE International Workshop on Current and Defect-Based Testing, May 2004, Napa Valley, CA, pp.89-94. ⟨lirmm-00108661⟩
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