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Automatic Test Pattern Generation for Resistive Bridging Faults

P. Engelke I. Polian Michel Renovell 1 P. Becker 
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108661
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Submitted on : Monday, October 23, 2006 - 8:52:41 AM
Last modification on : Friday, August 5, 2022 - 10:47:53 AM

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  • HAL Id : lirmm-00108661, version 1

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P. Engelke, I. Polian, Michel Renovell, P. Becker. Automatic Test Pattern Generation for Resistive Bridging Faults. IEEE International Workshop on Current and Defect-Based Testing, May 2004, Napa Valley, CA, pp.89-94. ⟨lirmm-00108661⟩

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