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Conference papers

Electrically-Induced Thermal Stimuli for MEMS Testing

Norbert Dumas 1 Florence Azaïs 1 Laurent Latorre 1 Pascal Nouet 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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Conference papers
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108904
Contributor : Christine Carvalho de Matos <>
Submitted on : Monday, October 23, 2006 - 12:57:12 PM
Last modification on : Thursday, May 24, 2018 - 3:59:24 PM

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  • HAL Id : lirmm-00108904, version 1

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CNRS | SYSMIC | LIRMM | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER

Citation

Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet. Electrically-Induced Thermal Stimuli for MEMS Testing. ETS: European Test Symposium, May 2004, Ajaccio, Corsica, France. pp.60-65. ⟨lirmm-00108904⟩

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