Supply voltage glitches effects on CMOS circuits

Abstract : Among the attacks applied on secure circuits which are described in the literature, we can find fault injection techniques. Fault attacks are conduced using a combination of environmental conditions that cause the chip to produce computational errors that can leak protected information. The aim of this article is to attempt to build a pertinent fault model representing CMOS circuit behaviour in presence of short supply voltage variations. The behaviour of the circuit in presence of fault depends strongly on the basic gates (combinational logic, registers...) architecture. Therefore, the fault model depends on the sensitivity of these basic elements towards the faults generated by the supply voltage glitches.
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Communication dans un congrès
IEEE International Mixed Signal Testing Workshop, Jun 2006, Edinburgh, pp.187-190, 2006
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00109069
Contributeur : Guy Cathébras <>
Soumis le : lundi 23 octobre 2006 - 16:44:57
Dernière modification le : jeudi 24 mai 2018 - 15:59:20

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  • HAL Id : lirmm-00109069, version 1

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Guy Cathébras, Anissa Djellid-Ouar, Frédéric Bancel. Supply voltage glitches effects on CMOS circuits. IEEE International Mixed Signal Testing Workshop, Jun 2006, Edinburgh, pp.187-190, 2006. 〈lirmm-00109069〉

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