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Electro-thermal short pulsed simulation for SOI technology

Christophe Entringer 1 Philippe Flatresse 1 Philippe Galy 1 Florence Azaïs 2 Pascal Nouet 2 
2 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00112981
Contributor : Florence Azais Connect in order to contact the contributor
Submitted on : Friday, November 10, 2006 - 12:56:46 PM
Last modification on : Friday, August 5, 2022 - 10:48:21 AM

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  • HAL Id : lirmm-00112981, version 1

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Christophe Entringer, Philippe Flatresse, Philippe Galy, Florence Azaïs, Pascal Nouet. Electro-thermal short pulsed simulation for SOI technology. ESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Oct 2006, Wuppertal, Germany. ⟨lirmm-00112981⟩

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