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Electro-thermal short pulsed simulation for SOI technology

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00112981
Contributor : Florence Azais <>
Submitted on : Friday, November 10, 2006 - 12:56:46 PM
Last modification on : Saturday, September 21, 2019 - 6:23:16 PM

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  • HAL Id : lirmm-00112981, version 1

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Christophe Entringer, Philippe Flatresse, Philippe Galy, Florence Azaïs, Pascal Nouet. Electro-thermal short pulsed simulation for SOI technology. ESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Oct 2006, Wuppertal, Germany. ⟨lirmm-00112981⟩

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