Electro-thermal short pulsed simulation for SOI technology - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2006
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lirmm-00112981 , version 1 (10-11-2006)

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  • HAL Id : lirmm-00112981 , version 1

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Christophe Entringer, Philippe Flatresse, Philippe Galy, Florence Azaïs, Pascal Nouet. Electro-thermal short pulsed simulation for SOI technology. ESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Oct 2006, Wuppertal, Germany. ⟨lirmm-00112981⟩
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