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A Novel DFT Technique to Test a Complete Set of ADC's and DAC's Embedded in a Complex SiP

Serge Bernard 1 Vincent Kerzérho 1, 2 Philippe Cauvet 2 Florence Azaïs 1 Mariane Comte 1 Michel Renovell 1 
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : This paper proposes an original Design-For-Test (DFT) technique allowing the test of a complete set of converters embedded in a complex System-in-Package. The fundamental idea consists in implementing an additional circuitry allowing to interconnect the analogue ouputs of DAC's with the analogue inputs of ADC's. This globally results in an Analogue Network of interconnected Converters (ANC) that can be tested in a fully digital way. It is demonstrated that different configurations of the network can be described through a system of linearly independent equations. Solving the system of equations allows to determine the harmonic contribution of every converter in the network
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Submitted on : Monday, November 20, 2006 - 2:08:36 PM
Last modification on : Friday, August 5, 2022 - 10:48:03 AM
Long-term archiving on: : Tuesday, April 6, 2010 - 11:05:11 PM


  • HAL Id : lirmm-00115131, version 1



Serge Bernard, Vincent Kerzérho, Philippe Cauvet, Florence Azaïs, Mariane Comte, et al.. A Novel DFT Technique to Test a Complete Set of ADC's and DAC's Embedded in a Complex SiP. IEEE Design & Test, IEEE, 2006, 23 (3), pp.237-243. ⟨lirmm-00115131⟩



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