Remote Access to Manufacturing Test Facilities: a Reality in IC, a dream in MEMS - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Other Publications Year : 2006

Remote Access to Manufacturing Test Facilities: a Reality in IC, a dream in MEMS

Abstract

Manufacturing test consists in verifying the quality of a product with respect to its specifications. For most of the manufactured products the cost of the final verification represents only a small part of the production costs. This is due to the fact that these products are either high-cost (e.g. automotive industry) or reliable enough to authorize randomly applied verification (e.g. food industry). This scheme doesn't apply in the microelectronics industry, where low-cost products are produced with a significant number of out-of-specification or non-functioning parts. Manufacturing tests are then required to verify the physical integrity and the correct behaviour of any produced parts at a reasonable cost. Mass production of MNT-based systems is following the same trend. That's the reason why we have to learn from this mature industry. The problem is that manufacturing test introduces a breakage in the batch fabrication concept. Indeed, speaking about malfunctions leads to singularities that cannot be dealt in a batch-based model. Even if test is undertaken at the wafer level and if parallelism is still possible each produced device must be tested independently.
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Dates and versions

lirmm-00128278 , version 1 (31-01-2007)

Identifiers

  • HAL Id : lirmm-00128278 , version 1

Cite

Laurent Latorre, Pascal Nouet, Pascal Dugénie, Stefano A. Cerri. Remote Access to Manufacturing Test Facilities: a Reality in IC, a dream in MEMS. 2006, pp.39-41. ⟨lirmm-00128278⟩
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