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Challenges in Manufacturing Test of MNT-based Systems

Pascal Nouet 1 
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00128280
Contributor : Pascal Nouet Connect in order to contact the contributor
Submitted on : Wednesday, January 31, 2007 - 3:22:48 PM
Last modification on : Friday, August 5, 2022 - 10:47:55 AM

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  • HAL Id : lirmm-00128280, version 1

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Pascal Nouet. Challenges in Manufacturing Test of MNT-based Systems. IMSTW'06: 12th International Mixed Signal Testing Workshop, Jun 2006. ⟨lirmm-00128280⟩

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