Challenges in Manufacturing Test of MNT-based Systems - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2006

Challenges in Manufacturing Test of MNT-based Systems

Pascal Nouet
Conception et Test de Systèmes MICroélectroniques
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Micro and nanotechnologies/Microelectronics

Pascal Nouet  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00128280

Submitted on : Wednesday, January 31, 2007-3:22:48 PM

Last modification on : Friday, March 24, 2023-2:52:48 PM

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lirmm-00128280 , version 1 (31-01-2007)

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  • HAL Id : lirmm-00128280 , version 1

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Pascal Nouet. Challenges in Manufacturing Test of MNT-based Systems. IMSTW'06: 12th International Mixed Signal Testing Workshop, Jun 2006. ⟨lirmm-00128280⟩

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