In this paper, we present an analysis of resistive-open defects in the write driver of SRAMs designed with the Infineon 65nm technology. From manufacturing data, we show that in some cases, a resistive-open defect may lead to a new type of dynamic behavior which has never been experienced in the past. This faulty behavior can be modeled as an un-restored destructive write fault (URDWF). Such URDWF is a consequence of the structural dependencies that exist between the write driver and the sense amplifier, and appears when a specific read operation is performed immediately after a specific write operation. Results of electrical simulations are presented to give a complete understanding of such a faulty behavior and to highlight the difference with a standard un-restored write fault (URWF) model. Next, a possible March test solution is presented to detect URDWF. Finally, a discussion is proposed on the opportunity to include new features in this part of the memory to easily distinguish between faults coming from the write driver (like URDWF) and those coming from other parts of the memory (sense amplifier, core-cells, etc.)