"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC

Vincent Kerzérho 1 Philippe Cauvet 2 Serge Bernard 1 Florence Azaïs 1 Mariane Comte 1 Michel Renovell 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : In this paper, complex mixed signal circuits such as SiP or SOC including several ADCs and DACs are considered. A new DFT technique is proposed allowing the test of this complete set of embedded ADCs and DACs in a fully digital way such that only a simple low cost tester can be used. Moreover, this technique called "analogue network of converters " (ANC) requires an extremely simple additional circuitry and interconnect.
Type de document :
Communication dans un congrès
ETS: European Test Symposium, May 2007, Freiburg, Germany. 12th IEEE European Test Symposium, pp.211-216, 2007, 〈10.1109/ETS.2007.1〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00158527
Contributeur : Martine Peridier <>
Soumis le : vendredi 29 juin 2007 - 09:41:54
Dernière modification le : jeudi 11 janvier 2018 - 06:27:19

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Vincent Kerzérho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, et al.. "Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. ETS: European Test Symposium, May 2007, Freiburg, Germany. 12th IEEE European Test Symposium, pp.211-216, 2007, 〈10.1109/ETS.2007.1〉. 〈lirmm-00158527〉

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