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Resistive-Open Defect Influences in SRAM I/O Circuitry

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00194282
Contributor : Arnaud Virazel <>
Submitted on : Thursday, December 6, 2007 - 11:27:40 AM
Last modification on : Wednesday, August 28, 2019 - 3:46:02 PM

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  • HAL Id : lirmm-00194282, version 1

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Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, et al.. Resistive-Open Defect Influences in SRAM I/O Circuitry. Colloque du GDR SoC-SiP, Jun 2007, Paris, France. ⟨lirmm-00194282⟩

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