Conference Papers
Year : 2007
Arnaud Virazel : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00194282
Submitted on : Thursday, December 6, 2007-11:27:40 AM
Last modification on : Friday, March 24, 2023-2:52:49 PM
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- HAL Id : lirmm-00194282 , version 1
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Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, et al.. Resistive-Open Defect Influences in SRAM I/O Circuitry. Colloque du GDR SoC-SiP, Jun 2007, Paris, France. ⟨lirmm-00194282⟩
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