Resistive-Open Defect Influences in SRAM I/O Circuitry - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2007

Resistive-Open Defect Influences in SRAM I/O Circuitry

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Micro and nanotechnologies/Microelectronics

Arnaud Virazel  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00194282

Submitted on : Thursday, December 6, 2007-11:27:40 AM

Last modification on : Friday, March 24, 2023-2:52:49 PM

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lirmm-00194282 , version 1 (06-12-2007)

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  • HAL Id : lirmm-00194282 , version 1

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Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, et al.. Resistive-Open Defect Influences in SRAM I/O Circuitry. Colloque du GDR SoC-SiP, Jun 2007, Paris, France. ⟨lirmm-00194282⟩

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