Improved Diagnosis Resolution without Physical Information

Abstract : This paper presents a diagnosis methodology able to improve the diagnosis resolution by considering only the logic information provided by the tester. The main advantage of the outlined methodology is the capability to deal with several fault models at a time, both static and dynamic, setting up a unified framework for logic diagnosis able to manage also transistor level faults. Experiments on ITC'99 benchmark circuits show the efficiency of the proposed method both in terms of diagnosis resolution and required CPU time.
Type de document :
Communication dans un congrès
DELTA'08: International Symposium on Electronic Design, Test & Applications, Jan 2008, IEEE, pp.210-215, 2008, 〈http://www.ece.ust.hk/delta2008/〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00260961
Contributeur : Alberto Bosio <>
Soumis le : mercredi 5 mars 2008 - 17:51:38
Dernière modification le : jeudi 24 mai 2018 - 15:59:24

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  • HAL Id : lirmm-00260961, version 1

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Alberto Bosio, Alexandre Rousset, Patrick Girard, Serge Pravossoudovitch, Christian Landrault, et al.. Improved Diagnosis Resolution without Physical Information. DELTA'08: International Symposium on Electronic Design, Test & Applications, Jan 2008, IEEE, pp.210-215, 2008, 〈http://www.ece.ust.hk/delta2008/〉. 〈lirmm-00260961〉

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