Low Voltage Testing of Gate Oxide Short in CMOS Technology - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2002
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lirmm-00268526 , version 1 (01-04-2008)

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  • HAL Id : lirmm-00268526 , version 1

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Michel Renovell, Jean-Marc J.-M. Galliere, Florence Azaïs, Yves Bertrand. Low Voltage Testing of Gate Oxide Short in CMOS Technology. DDECS: Design and Diagnostics of Electronic Circuits and Systems, 2002, Brno, Czech Republic. pp.168-174. ⟨lirmm-00268526⟩
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