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Low Voltage Testing of Gate Oxide Short in CMOS Technology

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00268526
Contributor : Christine Carvalho de Matos <>
Submitted on : Tuesday, April 1, 2008 - 9:27:39 AM
Last modification on : Friday, July 20, 2018 - 6:20:57 PM

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  • HAL Id : lirmm-00268526, version 1

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Michel Renovell, Jean-Marc Galliere, Florence Azaïs, Yves Bertrand. Low Voltage Testing of Gate Oxide Short in CMOS Technology. DDECS: Design and Diagnostics of Electronic Circuits and Systems, 2002, Brno, Czech Republic. pp.168-174. ⟨lirmm-00268526⟩

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