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High Defect Coverage with Low Power Test Sequences in a BIST Environment

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00268585
Contributor : Christine Carvalho de Matos <>
Submitted on : Tuesday, April 1, 2008 - 9:27:54 AM
Last modification on : Wednesday, August 28, 2019 - 3:46:02 PM

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  • HAL Id : lirmm-00268585, version 1

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Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Hans-Joachim Wunderlich. High Defect Coverage with Low Power Test Sequences in a BIST Environment. IEEE Design & Test, IEEE, 2002, 19 (5), pp.44-52. ⟨lirmm-00268585⟩

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