Skip to Main content Skip to Navigation
Journal articles

High Defect Coverage with Low Power Test Sequences in a BIST Environment

Complete list of metadata

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00268585
Contributor : Christine Carvalho de Matos <>
Submitted on : Tuesday, April 1, 2008 - 9:27:54 AM
Last modification on : Friday, November 27, 2020 - 6:04:03 PM

Identifiers

  • HAL Id : lirmm-00268585, version 1

Collections

Citation

Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Hans-Joachim Wunderlich. High Defect Coverage with Low Power Test Sequences in a BIST Environment. IEEE Design & Test, IEEE, 2002, 19 (5), pp.44-52. ⟨lirmm-00268585⟩

Share

Metrics

Record views

130