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Improving Defect Detection in Static-Voltage Testing

Michel Renovell 1 Florence Azaïs 1 Yves Bertrand 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00268605
Contributor : Christine Carvalho de Matos <>
Submitted on : Tuesday, April 1, 2008 - 9:28:02 AM
Last modification on : Friday, July 20, 2018 - 12:34:01 PM

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  • HAL Id : lirmm-00268605, version 1

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Michel Renovell, Florence Azaïs, Yves Bertrand. Improving Defect Detection in Static-Voltage Testing. IEEE Design & Test, IEEE, 2002, 17 (6), pp.83-89. ⟨lirmm-00268605⟩

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