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A Simple and Effective Compression Scheme for Test Pins Reduction

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00269326
Contributor : Christine Carvalho de Matos <>
Submitted on : Wednesday, April 2, 2008 - 4:46:00 PM
Last modification on : Tuesday, October 23, 2018 - 10:46:02 AM

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  • HAL Id : lirmm-00269326, version 1

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Marie-Lise Flottes, Régis Poirier, Bruno Rouzeyre. A Simple and Effective Compression Scheme for Test Pins Reduction. HLDVT'02: IEEE International Workshop on High Level Design Validation and Test, Cannes (France), France. pp. 165-168. ⟨lirmm-00269326⟩

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