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A Unified DFT Approach for BIST and External Test

Marie-Lise Flottes 1 Christian Landrault 1 Aurélia Petitqueux 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00269517
Contributor : Christine Carvalho de Matos <>
Submitted on : Thursday, April 3, 2008 - 8:21:40 AM
Last modification on : Thursday, May 24, 2018 - 3:59:24 PM

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  • HAL Id : lirmm-00269517, version 1

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Marie-Lise Flottes, Christian Landrault, Aurélia Petitqueux. A Unified DFT Approach for BIST and External Test. Journal of Electronic Testing, Springer Verlag, 2003, 19 (1), pp.49-60. ⟨lirmm-00269517⟩

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