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Structural Testing of Modern Reconfigurable Chips

Michel Renovell 1 
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : This paper presents recent developments for testing SRAM-based FPGAs using a structural approach. The specific architecture of these new chips is first presented identifying the specific FPGA test problems as well as the FPGA test properties. The FPGA architecture is then conceptually divided into different architectural elements. For each architectural element test configurations and test vectors are derived targeting the assumed fault models.
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Submitted on : Thursday, July 19, 2018 - 4:36:28 PM
Last modification on : Friday, August 5, 2022 - 10:48:13 AM
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  • HAL Id : lirmm-00269648, version 1



Michel Renovell. Structural Testing of Modern Reconfigurable Chips. EWDTC: East-West Design & Test Conference, Sep 2003, Moscou, Russia. pp.5-9. ⟨lirmm-00269648⟩



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