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Conference Papers Year : 2003

Structural Testing of Modern Reconfigurable Chips

Abstract

This paper presents recent developments for testing SRAM-based FPGAs using a structural approach. The specific architecture of these new chips is first presented identifying the specific FPGA test problems as well as the FPGA test properties. The FPGA architecture is then conceptually divided into different architectural elements. For each architectural element test configurations and test vectors are derived targeting the assumed fault models.
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Dates and versions

lirmm-00269648 , version 1 (19-07-2018)

Identifiers

  • HAL Id : lirmm-00269648 , version 1

Cite

Michel Renovell. Structural Testing of Modern Reconfigurable Chips. EWDTC: East-West Design & Test Conference, Sep 2003, Moscou, Russia. pp.5-9. ⟨lirmm-00269648⟩
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