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Modeling the Random Parameter Effects in a Non-Split Model of Gate Oxide Short

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00269754
Contributor : Christine Carvalho de Matos <>
Submitted on : Thursday, April 3, 2008 - 8:22:38 AM
Last modification on : Friday, July 20, 2018 - 12:34:01 PM

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  • HAL Id : lirmm-00269754, version 1

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Michel Renovell, Jean-Marc Galliere, Florence Azaïs, Yves Bertrand. Modeling the Random Parameter Effects in a Non-Split Model of Gate Oxide Short. Journal of Electronic Testing, Springer Verlag, 2003, 19 (4), pp. 377-386. ⟨lirmm-00269754⟩

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