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Statistical Sizing of an eSRAM Dummy Bitline Driver for Read Margin Improvement in the Presence of Variability Aspects

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00280716
Contributor : Martine Peridier <>
Submitted on : Monday, May 19, 2008 - 3:40:30 PM
Last modification on : Tuesday, June 18, 2019 - 11:50:05 AM

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  • HAL Id : lirmm-00280716, version 1

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Michael Yap San Min, Philippe Maurine, Magali Bastian Hage-Hassan, Michel Robert. Statistical Sizing of an eSRAM Dummy Bitline Driver for Read Margin Improvement in the Presence of Variability Aspects. ISVLSI'08: IEEE Computer Society Annual Symposium on VLSI, Apr 2008, Montpellier, France, pp.310-315. ⟨lirmm-00280716⟩

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