Statistical Sizing of an eSRAM Dummy Bitline Driver for Read Margin Improvement in the Presence of Variability Aspects - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2008

Statistical Sizing of an eSRAM Dummy Bitline Driver for Read Margin Improvement in the Presence of Variability Aspects

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00280716

Submitted on : Monday, May 19, 2008-3:40:30 PM

Last modification on : Friday, March 24, 2023-2:52:50 PM

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lirmm-00280716 , version 1 (19-05-2008)

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  • HAL Id : lirmm-00280716 , version 1

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Michael Yap San Min, Philippe Maurine, Magali Bastian Hage-Hassan, Michel Robert. Statistical Sizing of an eSRAM Dummy Bitline Driver for Read Margin Improvement in the Presence of Variability Aspects. ISVLSI'08: IEEE Computer Society Annual Symposium on VLSI, Apr 2008, Montpellier, France, pp.310-315. ⟨lirmm-00280716⟩

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