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A Simulator of Small-Delay Faults Caused by Resistive-Open Defects

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00285886
Contributor : Martine Peridier <>
Submitted on : Friday, June 6, 2008 - 3:14:23 PM
Last modification on : Friday, July 20, 2018 - 12:34:01 PM

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  • HAL Id : lirmm-00285886, version 1

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Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, et al.. A Simulator of Small-Delay Faults Caused by Resistive-Open Defects. ETS: European Test Symposium, May 2008, Verbania, Italy. pp.113-118. ⟨lirmm-00285886⟩

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