A Simulator of Small-Delay Faults Caused by Resistive-Open Defects - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2008
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lirmm-00285886 , version 1 (06-06-2008)

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  • HAL Id : lirmm-00285886 , version 1

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Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, et al.. A Simulator of Small-Delay Faults Caused by Resistive-Open Defects. ETS: European Test Symposium, May 2008, Verbania, Italy. pp.113-118. ⟨lirmm-00285886⟩
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