A Simulator of Small-Delay Faults Caused by Resistive-Open Defects - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2008

A Simulator of Small-Delay Faults Caused by Resistive-Open Defects

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00285886

Submitted on : Friday, June 6, 2008-3:14:23 PM

Last modification on : Friday, March 24, 2023-2:52:50 PM

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lirmm-00285886 , version 1 (06-06-2008)

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  • HAL Id : lirmm-00285886 , version 1

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Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, et al.. A Simulator of Small-Delay Faults Caused by Resistive-Open Defects. ETS: European Test Symposium, May 2008, Verbania, Italy. pp.113-118. ⟨lirmm-00285886⟩

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