Pressure Sensor for Smart Wafer-Level Packaging of MEMS - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Poster Year : 2008

Pressure Sensor for Smart Wafer-Level Packaging of MEMS

Abstract

Systems in Package (SiP) contain more and more MEMS components such as resonators for time references or RF filtering. These resonators are packaged at wafer level and the cavity quality has to be guaranteed in terms of pressure and humidity level by the final manufacturing test. Therefore, environmental sensors could be integrated in the cavity to control these parameters and/or to calibrate the MEMS resonator with an electronic loopback. This paper presents the design of a low-cost pressure sensor for such application.
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Dates and versions

lirmm-00325109 , version 1 (26-09-2008)

Identifiers

  • HAL Id : lirmm-00325109 , version 1

Cite

Nicolas Pous, Frédérick Mailly, Laurent Latorre, Emile Martincic, Fabrice Verjus, et al.. Pressure Sensor for Smart Wafer-Level Packaging of MEMS. EUROSENSORS, Sep 2008, Dresden, Germany. 22nd European Conference on Solid-State Transducers, pp.408-411, 2008. ⟨lirmm-00325109⟩
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