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Stuck-at-Faults Test using Differential Power Analysis

Giorgio Di Natale 1 Marie-Lise Flottes 1 Bruno Rouzeyre 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : In this paper we propose a new strategy for fault obser-vation based on the measurement of the power con-sumed by the circuit during the application of test vec-tors. Power supply measures and analysis used for the proposed technique are based on the Differential Power Analysis (DPA) method, originally proposed to tamper crypto devices.
Mots-clés : Test DPA
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00332529
Contributor : Giorgio Di Natale <>
Submitted on : Tuesday, October 21, 2008 - 10:42:39 AM
Last modification on : Tuesday, September 1, 2020 - 11:32:04 AM

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  • HAL Id : lirmm-00332529, version 1

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Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Stuck-at-Faults Test using Differential Power Analysis. LPonTR'08: Workshop on Low Power Design Impact on Test and Reliability, May 2008, Italy. ⟨lirmm-00332529⟩

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