Stuck-at-Faults Test using Differential Power Analysis - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2008

Stuck-at-Faults Test using Differential Power Analysis

Abstract

In this paper we propose a new strategy for fault obser-vation based on the measurement of the power con-sumed by the circuit during the application of test vec-tors. Power supply measures and analysis used for the proposed technique are based on the Differential Power Analysis (DPA) method, originally proposed to tamper crypto devices.

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Dates and versions

lirmm-00332529 , version 1 (21-10-2008)

Identifiers

  • HAL Id : lirmm-00332529 , version 1

Cite

Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Stuck-at-Faults Test using Differential Power Analysis. LPonTR'08: Workshop on Low Power Design Impact on Test and Reliability, May 2008, Italy. ⟨lirmm-00332529⟩
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