Stuck-at-Faults Test using Differential Power Analysis

Giorgio Di Natale 1 Marie-Lise Flottes 1 Bruno Rouzeyre 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : In this paper we propose a new strategy for fault obser-vation based on the measurement of the power con-sumed by the circuit during the application of test vec-tors. Power supply measures and analysis used for the proposed technique are based on the Differential Power Analysis (DPA) method, originally proposed to tamper crypto devices.
Mots-clés : Test DPA
Type de document :
Communication dans un congrès
LPonTR'08: Workshop on Low Power Design Impact on Test and Reliability, May 2008, Italy. 2008, 〈http://www.cad.polito.it/~ets08/LPonTR/LPonTR.html〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00332529
Contributeur : Giorgio Di Natale <>
Soumis le : mardi 21 octobre 2008 - 10:42:39
Dernière modification le : jeudi 24 mai 2018 - 15:59:24

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  • HAL Id : lirmm-00332529, version 1

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Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Stuck-at-Faults Test using Differential Power Analysis. LPonTR'08: Workshop on Low Power Design Impact on Test and Reliability, May 2008, Italy. 2008, 〈http://www.cad.polito.it/~ets08/LPonTR/LPonTR.html〉. 〈lirmm-00332529〉

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