New March Elements for Address Decoder Open and Resistive Open Fault Detection in SRAM Memories

Abstract : This paper presents a complete analysis of the ability of March tests to detect ADOFs (Address Decoder Open Faults) and resistive-ADOFs in address decoders of embedded-SRAMs. Such faults are the primary target of this study because they are notoriously hard-to-detect. With this study, we show that standard March tests without modifications are not able to detect them and we propose to translate the algorithm presented in [1, 2] into March elements. These new March elements involve a particular address sequence and data to be written. For this purpose, we have exploited some Degrees of Freedom of the March tests (DOF I and IV) in order to generate these new March elements for ADOFs detection. Compared to the previous March solutions, these new March elements ensure the fault observation.
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Article dans une revue
Journal of Integrated Circuits and Systems, Brazilian Microelectronics Society, 2008, 3 (1), pp.7-12
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00341793
Contributeur : Arnaud Virazel <>
Soumis le : mercredi 26 novembre 2008 - 09:18:19
Dernière modification le : jeudi 11 janvier 2018 - 02:08:12

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  • HAL Id : lirmm-00341793, version 1

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Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, et al.. New March Elements for Address Decoder Open and Resistive Open Fault Detection in SRAM Memories. Journal of Integrated Circuits and Systems, Brazilian Microelectronics Society, 2008, 3 (1), pp.7-12. 〈lirmm-00341793〉

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