SoC Yield Improvement: Redundant Architectures to the Rescue - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Poster Year : 2008

SoC Yield Improvement: Redundant Architectures to the Rescue

Abstract

Manufacturing processes in the nanoscale era are less and less reliable thus leading to lower and lower yield. In this paper we investigate the usage of TMR architectures for logic cores to increase SoC yield.
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Dates and versions

lirmm-00341799 , version 1 (26-11-2008)

Identifiers

  • HAL Id : lirmm-00341799 , version 1

Cite

Julien Vial, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, et al.. SoC Yield Improvement: Redundant Architectures to the Rescue. ITC'2008: International Test Conference, Oct 2008, Santa Clara, CA, United States. IEEE, pp.7, 2008. ⟨lirmm-00341799⟩
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