A History-Based Technique for Faults Diagnosis in SRAMs

Abstract : In this paper, we present a new diagnosis approach that represents an alternative to signature-based approaches. This new diagnosis technique, named history-based diagnosis, makes use of the effect-cause paradigm already developed for logic design diagnosis. It consists in creating a database containing the history of operations (read and write) performed on a faulty memory core-cell. This database is further used to generate diagnosis results.
Type de document :
Communication dans un congrès
Colloque GDR SoC-SiP, France. 2008
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Contributeur : Arnaud Virazel <>
Soumis le : mercredi 26 novembre 2008 - 10:08:03
Dernière modification le : vendredi 2 mars 2018 - 19:36:02


  • HAL Id : lirmm-00341821, version 1



Alexandre Ney, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, et al.. A History-Based Technique for Faults Diagnosis in SRAMs. Colloque GDR SoC-SiP, France. 2008. 〈lirmm-00341821〉



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