A History-Based Technique for Faults Diagnosis in SRAMs
Abstract
In this paper, we present a new diagnosis approach that represents an alternative to signature-based approaches. This new diagnosis technique, named history-based diagnosis, makes use of the effect-cause paradigm already developed for logic design diagnosis. It consists in creating a database containing the history of operations (read and write) performed on a faulty memory core-cell. This database is further used to generate diagnosis results.