A History-Based Technique for Faults Diagnosis in SRAMs - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2008

A History-Based Technique for Faults Diagnosis in SRAMs

Abstract

In this paper, we present a new diagnosis approach that represents an alternative to signature-based approaches. This new diagnosis technique, named history-based diagnosis, makes use of the effect-cause paradigm already developed for logic design diagnosis. It consists in creating a database containing the history of operations (read and write) performed on a faulty memory core-cell. This database is further used to generate diagnosis results.
No file

Dates and versions

lirmm-00341821 , version 1 (26-11-2008)

Identifiers

  • HAL Id : lirmm-00341821 , version 1

Cite

Alexandre Ney, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, et al.. A History-Based Technique for Faults Diagnosis in SRAMs. Colloque GDR SoC-SiP, France. ⟨lirmm-00341821⟩
67 View
0 Download

Share

Gmail Mastodon Facebook X LinkedIn More