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A History-Based Technique for Faults Diagnosis in SRAMs

Abstract : In this paper, we present a new diagnosis approach that represents an alternative to signature-based approaches. This new diagnosis technique, named history-based diagnosis, makes use of the effect-cause paradigm already developed for logic design diagnosis. It consists in creating a database containing the history of operations (read and write) performed on a faulty memory core-cell. This database is further used to generate diagnosis results.
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00341821
Contributor : Arnaud Virazel <>
Submitted on : Wednesday, November 26, 2008 - 10:08:03 AM
Last modification on : Wednesday, August 28, 2019 - 3:46:02 PM

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  • HAL Id : lirmm-00341821, version 1

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Alexandre Ney, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, et al.. A History-Based Technique for Faults Diagnosis in SRAMs. Colloque GDR SoC-SiP, France. ⟨lirmm-00341821⟩

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