A BIST Structure to Test Delay Faults in a Scan Environment

Abstract : When stuck-at faults are targeted, scan design reduces the complexity of the test problem. But for delay fault testing, the standard scan structures are not so efficient, because delay fault testing requires the application of dedicated consecutive two-pattern tests. In a standard scan environment, pre-determined two pattern tests cannot be applied to the circuit under test because of the serial shifting procedure. In the literature, different scan modification possibilities have been proposed for applying delay fault oriented deterministic test patterns. Another issue to the delay fault testing problem in scan-based sequential circuits is presented in this paper. The solution combines a BIST structure with the standard scan design.
Type de document :
Communication dans un congrès
ATS: Asian Test Symposium, Dec 1998, Singapore, Singapore. pp.435-439, 1998
Liste complète des métadonnées

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00345798
Contributeur : Arnaud Virazel <>
Soumis le : mercredi 10 décembre 2008 - 09:21:39
Dernière modification le : jeudi 24 mai 2018 - 15:59:24

Identifiants

  • HAL Id : lirmm-00345798, version 1

Collections

Citation

Patrick Girard, Christian Landrault, Véronique Moreda, Serge Pravossoudovitch, Arnaud Virazel. A BIST Structure to Test Delay Faults in a Scan Environment. ATS: Asian Test Symposium, Dec 1998, Singapore, Singapore. pp.435-439, 1998. 〈lirmm-00345798〉

Partager

Métriques

Consultations de la notice

79