Biomedical Circuits: New Challenges for Design and Test - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2008

Biomedical Circuits: New Challenges for Design and Test

Abstract

Biomedical applications give specific constraints on design and test for integrated circuit used in implant. The differences are in terms of the number of devices to product, the required quality, reliability, safety? For instance, for test in classical applications, the main target is the cost of production test, but for medical applications the main issues are during the life of the circuit. We propose an overview of these new challenges in describing the classical and medical contexts and the specific associated constraints. By way of illustration, we will see some cases of implant constraints and the consequences on strategy on design and test.
No file

Dates and versions

lirmm-00370937 , version 1 (25-03-2009)

Identifiers

  • HAL Id : lirmm-00370937 , version 1

Cite

Serge Bernard. Biomedical Circuits: New Challenges for Design and Test. IMS3TW'08: IEEE International Mixed-Signals, Sensors and Systems Test Workshop, Jun 2008, Vancouver, Canada. ⟨lirmm-00370937⟩
181 View
0 Download

Share

Gmail Mastodon Facebook X LinkedIn More