Analysis of Resistive-Open Defects in SRAM Sense Amplifiers - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Journal Articles IEEE Transactions on Very Large Scale Integration (VLSI) Systems Year : 2009
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lirmm-00371367 , version 1 (27-03-2009)

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Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian Hage-Hassan. Analysis of Resistive-Open Defects in SRAM Sense Amplifiers. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2009, 17 (10), pp.1556-1559. ⟨10.1109/TVLSI.2008.2005194⟩. ⟨lirmm-00371367⟩
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