Journal Articles
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Year : 2009
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00371367
Submitted on : Friday, March 27, 2009-3:44:38 PM
Last modification on : Friday, April 28, 2023-2:27:53 PM
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Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian Hage-Hassan. Analysis of Resistive-Open Defects in SRAM Sense Amplifiers. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2009, 17 (10), pp.1556-1559. ⟨10.1109/TVLSI.2008.2005194⟩. ⟨lirmm-00371367⟩
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