Analysis of Resistive-Open Defects in SRAM Sense Amplifiers

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00371367
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Submitted on : Friday, March 27, 2009 - 3:44:38 PM
Last modification on : Thursday, May 24, 2018 - 3:59:24 PM

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Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian. Analysis of Resistive-Open Defects in SRAM Sense Amplifiers. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2009, 17 (10), pp.1556-1559. ⟨lirmm-00371367⟩

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