A Fault-Simulation-Based Approach for Logic Diagnosis

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Communication dans un congrès
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2009, Cairo, Egypt. 4th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, pp.216-221, 2009
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00371377
Contributeur : Martine Peridier <>
Soumis le : vendredi 27 mars 2009 - 16:05:36
Dernière modification le : jeudi 24 mai 2018 - 15:59:24

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  • HAL Id : lirmm-00371377, version 1

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Youssef Benabboud, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, et al.. A Fault-Simulation-Based Approach for Logic Diagnosis. DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2009, Cairo, Egypt. 4th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, pp.216-221, 2009. 〈lirmm-00371377〉

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