Benefit on Interconnect Performance of a Relaxed Wire Density in a 45 nm Node of the Back End of Line

Complete list of metadatas

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00485629
Contributor : Martine Peridier <>
Submitted on : Friday, May 21, 2010 - 11:53:19 AM
Last modification on : Tuesday, February 12, 2019 - 12:50:04 PM

Identifiers

  • HAL Id : lirmm-00485629, version 1

Citation

Sébastien de Rivaz, Alexis Farcy, Denis Deschacht, Thierry Lacrevaz, Bernard Flechet. Benefit on Interconnect Performance of a Relaxed Wire Density in a 45 nm Node of the Back End of Line. IEEE 14th Workshop on Signal Propagation on Interconnects, Germany. pp.9. ⟨lirmm-00485629⟩

Share

Metrics

Record views

150