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Conference Papers Year : 2010

On-Chip Process Variability Monitoring

Nabila Moubdi
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  • PersonId : 859468
Robin M. Wilson
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  • PersonId : 884985
Vincent Dumettier
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  • PersonId : 884986
Abhishek Bansal
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Sebastien Barasinski
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Pierre Busson
Sylvain Engels


This paper aims at presenting the benefits obtained from the implementation of the on-chip process monitoring techniques on industrial integrated systems. Among the integrated process monitoring techniques, the main one aims at reducing the supply voltage of fast circuits in order to reduce their power consumption while maintaining the specified operating frequency. The proposed process monitoring flow includes efficient methodologies to gather/sort on-chip process data but also post-silicon tuning strategies and validation methods at both design and test steps. Concrete results are introduced in this paper to demonstrate the added value of such a methodology. More precisely, it is shown that its application leads to an overall energy reduction ranging from 10% to 20% on fast chips.
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Dates and versions

lirmm-00546337 , version 1 (14-12-2010)


  • HAL Id : lirmm-00546337 , version 1


Nabila Moubdi, Philippe Maurine, Robin M. Wilson, Nadine Azemard, Vincent Dumettier, et al.. On-Chip Process Variability Monitoring. VARI: Workshop on CMOS Variability, May 2010, Montpellier, France. ⟨lirmm-00546337⟩
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