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Journal Articles IEEE Transactions on Computers Year : 2010

A Comprehensive Framework for Logic Diagnosis of Arbitrary Defects

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Micro and nanotechnologies/Microelectronics

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Submitted on : Friday, January 7, 2011-3:20:49 PM

Last modification on : Friday, March 24, 2023-2:52:54 PM

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lirmm-00553545 , version 1 (07-01-2011)

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Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel. A Comprehensive Framework for Logic Diagnosis of Arbitrary Defects. IEEE Transactions on Computers, 2010, 59 (3), pp.289-300. ⟨10.1109/TC.2009.177⟩. ⟨lirmm-00553545⟩

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