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A Comprehensive Framework for Logic Diagnosis of Arbitrary Defects

Alberto Bosio 1 Patrick Girard 1 Serge Pravossoudovitch 1 Arnaud Virazel 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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Journal articles
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00553545
Contributor : Martine Peridier <>
Submitted on : Friday, January 7, 2011 - 3:20:49 PM
Last modification on : Wednesday, August 28, 2019 - 3:46:02 PM

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  • HAL Id : lirmm-00553545, version 1

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CNRS | SYSMIC | LIRMM | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER

Citation

Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel. A Comprehensive Framework for Logic Diagnosis of Arbitrary Defects. IEEE Transactions on Computers, Institute of Electrical and Electronics Engineers, 2010, 59 (3), pp.289-300. ⟨lirmm-00553545⟩

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