A Comprehensive Analysis of Transition Fault Coverage and Test Power Dissipation for LOS and LOC Schemes - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Journal Articles Journal of Low Power Electronics Year : 2010

A Comprehensive Analysis of Transition Fault Coverage and Test Power Dissipation for LOS and LOC Schemes

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00553548

Submitted on : Friday, January 7, 2011-3:25:55 PM

Last modification on : Tuesday, October 15, 2024-3:03:32 PM

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lirmm-00553548 , version 1 (07-01-2011)

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Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. A Comprehensive Analysis of Transition Fault Coverage and Test Power Dissipation for LOS and LOC Schemes. Journal of Low Power Electronics, 2010, 6 (2), pp.359-374. ⟨10.1166/jolpe.2010.1086⟩. ⟨lirmm-00553548⟩

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