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Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell Layouts

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00559034
Contributor : Martine Peridier <>
Submitted on : Monday, January 24, 2011 - 4:26:40 PM
Last modification on : Thursday, November 26, 2020 - 4:16:03 PM

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Paolo Rech, Michelangelo Grosso, Fabio Melchiori, Domenico Loparco, Davide Appello, et al.. Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell Layouts. IOLTS: International On-Line Testing Symposium, Jul 2010, Corfu, Greece. pp.29-34, ⟨10.1109/IOLTS.2010.5560236⟩. ⟨lirmm-00559034⟩

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