Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell Layouts - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2010

Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell Layouts

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00559034

Submitted on : Monday, January 24, 2011-4:26:40 PM

Last modification on : Friday, March 24, 2023-2:52:54 PM

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lirmm-00559034 , version 1 (24-01-2011)

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Paolo Rech, Michelangelo Grosso, Fabio Melchiori, Domenico Loparco, Davide Appello, et al.. Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell Layouts. IOLTS: International On-Line Testing Symposium, Jul 2010, Corfu, Greece. pp.29-34, ⟨10.1109/IOLTS.2010.5560236⟩. ⟨lirmm-00559034⟩

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