Skip to Main content Skip to Navigation
Conference papers

Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell Layouts

Complete list of metadata

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00559034
Contributor : Martine Peridier Connect in order to contact the contributor
Submitted on : Monday, January 24, 2011 - 4:26:40 PM
Last modification on : Friday, August 5, 2022 - 10:48:15 AM

Identifiers

Collections

Citation

Paolo Rech, Michelangelo Grosso, Fabio Melchiori, Domenico Loparco, Davide Appello, et al.. Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell Layouts. IOLTS: International On-Line Testing Symposium, Jul 2010, Corfu, Greece. pp.29-34, ⟨10.1109/IOLTS.2010.5560236⟩. ⟨lirmm-00559034⟩

Share

Metrics

Record views

70