Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell Layouts

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Communication dans un congrès
IOLTS: International On-Line Testing Symposium, Jul 2010, Corfu, Greece. 16th IEEE International Symposium on On-Line Testing and Robust System Design, pp.29-34, 2010, 〈10.1109/IOLTS.2010.5560236〉
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Contributeur : Martine Peridier <>
Soumis le : lundi 24 janvier 2011 - 16:26:40
Dernière modification le : lundi 11 février 2019 - 15:46:26

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Paolo Rech, Michelangelo Grosso, Fabio Melchiori, Domenico Loparco, Davide Appello, et al.. Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell Layouts. IOLTS: International On-Line Testing Symposium, Jul 2010, Corfu, Greece. 16th IEEE International Symposium on On-Line Testing and Robust System Design, pp.29-34, 2010, 〈10.1109/IOLTS.2010.5560236〉. 〈lirmm-00559034〉

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