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X-Identification of Transition Delay Fault Tests for Launch-off Shift Scheme

Kohei Miyase 1 Fangmei Wu 2 Luigi Dilillo 3 Alberto Bosio 3 Patrick Girard 3 Xiaoqing Wen 1 Seiji Kajihara 1
1 Kyushu Institute of Technology
2 LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
3 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Résumé : N/A
Document type :
Conference papers
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00566869
Contributor : Martine Peridier <>
Submitted on : Thursday, February 17, 2011 - 11:44:10 AM
Last modification on : Monday, November 30, 2020 - 9:30:04 AM

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  • HAL Id : lirmm-00566869, version 1

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CNRS | SYSMIC | LIRMM | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER

Citation

Kohei Miyase, Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, et al.. X-Identification of Transition Delay Fault Tests for Launch-off Shift Scheme. WRTLT'10: 11th IEEE Workshop On RTL and High Level Testing, Shanghai, China. pp.N/A. ⟨lirmm-00566869⟩

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