A Study of Path Delay Variations in the Presence of Uncorrelated Power and Ground Supply Noise

Aida Todri-Sanial 1 Alberto Bosio 1 Luigi Dilillo 1 Patrick Girard 1 Serge Pravossoudovitch 1 Arnaud Virazel 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : As technology scales down, the effects of power supply noise and ground bounce are becoming significantly important. In the existing literature, it has been shown that excessive power supply noise can affect the path delay, while ground bounce is either neglected or assumed similar to power supply noise. In this work, we present a detailed study of combined and uncorrelated power supply noise and ground bounce and their impact on the path delay. Our analyses show that different combination of power supply noise and ground bounce can lead to either delay speed-up or slow-down. Furthermore, our study shows the degrading influence of supply noise resonance on the path delay. We perform HSPICE simulations for path delay analysis on various technology nodes i.e. 130nm, 90nm, 65nm and 45nm.
Type de document :
Communication dans un congrès
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2011, Cottbus, Germany. Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011 IEEE 14th International Symposium on, pp.189-194, 2011, 〈10.1109/DDECS.2011.5783078〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00592000
Contributeur : Martine Peridier <>
Soumis le : mardi 10 mai 2011 - 16:58:15
Dernière modification le : mardi 25 septembre 2018 - 14:30:02

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Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, et al.. A Study of Path Delay Variations in the Presence of Uncorrelated Power and Ground Supply Noise. DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2011, Cottbus, Germany. Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011 IEEE 14th International Symposium on, pp.189-194, 2011, 〈10.1109/DDECS.2011.5783078〉. 〈lirmm-00592000〉

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