Skip to Main content Skip to Navigation
Conference papers

Statistical Timing Characterization of Standard Cells with Semi-Monte-Carlo Method

Abstract : Monte Carlo (MC) method is the standard method to characterize statistical moments of cell delays and slopes. However, this method suffers from very high computational cost. In this paper, we propose a technique to quickly and accurately estimate Standard Deviation (SD) of standard cell delays and slopes. The proposed technique is based on the identification, performed with a reduced set of MC simulations, of delay and output slope SD functions that take input slope, output load and supply voltage as input arguments. These identified functions are then used to estimate SDs of delays and slopes at different operating conditions (input slope, output load, supply voltage). This proposed method provides at least ퟕퟔ% of CPU gains, with respect to MC, while keeping high accuracy.
Complete list of metadatas

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00617593
Contributor : Nadine Azemard <>
Submitted on : Monday, August 29, 2011 - 4:51:59 PM
Last modification on : Wednesday, January 29, 2020 - 11:16:03 AM

Identifiers

  • HAL Id : lirmm-00617593, version 1

Collections

Citation

Nadine Azemard, Zeqin Wu, Philippe Maurine, Gilles R. Ducharme. Statistical Timing Characterization of Standard Cells with Semi-Monte-Carlo Method. VARI: Workshop on CMOS Variaility, May 2011, Grenoble, France. ⟨lirmm-00617593⟩

Share

Metrics

Record views

153