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Conference Papers Year : 2011

Characterizing Statistical Cells Timing Metrics with Semi-Monte-Carlo Method

Abstract

Monte Carlo (MC) method is the standard method to characterize statistical moments of cell delays and slopes. However, this method suffers from very high computational cost. In this paper, we propose a technique to quickly and accurately estimate Standard Deviation (SD) of standard cell delays and slopes. The proposed technique is based on the identification, performed with a reduced set of MC simulations, of delay and output slope SD functions that take input slope, output load and supply voltage as input arguments. These identified functions are then used to estimate SDs of delays and slopes at different operating conditions (input slope, output load, supply voltage). This proposed method provides at least ퟕퟔ% of CPU gains, with respect to MC, while keeping high accuracy.
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Dates and versions

lirmm-00617606 , version 1 (29-08-2011)

Identifiers

  • HAL Id : lirmm-00617606 , version 1

Cite

Nadine Azemard, Zeqin Wu, Philippe Maurine, Gilles R. Ducharme. Characterizing Statistical Cells Timing Metrics with Semi-Monte-Carlo Method. VLSI-SoC: Very Large Scale Integration - System-on-Chip, Oct 2011, Hong-Kong, China. ⟨lirmm-00617606⟩
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