Statistical Timing Characterization

Abstract : Monte Carlo (MC) method is the standard method to characterize statistical moments of cell delays and slopes. However, this method suffers from very high computational cost. In this paper, we propose a technique to quickly and accurately estimate Standard Deviation (SD) of standard cell delays and slopes. The proposed technique is based on the identification, performed with a reduced set of MC simulations, of delay and output slope SD functions that take input slope, output load and supply voltage as input arguments. These identified functions are then used to estimate SDs of delays and slopes at different operating conditions (input slope, output load, supply voltage). This proposed method provides at least % of CPU gains, with respect to MC, while keeping high accuracy.
Type de document :
Poster
S0C'12: International Symposium on System-on-Chip, Oct 2012, Tmapere, Finland. pp.N/A, 2012
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00762107
Contributeur : Nadine Azemard <>
Soumis le : jeudi 6 décembre 2012 - 14:35:18
Dernière modification le : mercredi 17 octobre 2018 - 17:20:02

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  • HAL Id : lirmm-00762107, version 1

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Nadine Azemard, Zeqin Wu, Philippe Maurine, Gille Ducharme. Statistical Timing Characterization. S0C'12: International Symposium on System-on-Chip, Oct 2012, Tmapere, Finland. pp.N/A, 2012. 〈lirmm-00762107〉

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