Making predictive analog/RF alternate test strategy independent of training set size

Haithem Ayari 1 Florence Azaïs 1 Serge Bernard 1 Mariane Comte 1 Vincent Kerzérho 1 Olivier Potin 1 Michel Renovell 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : This paper presents an alternate test implementation based on model redundancy that permits to achieve lower prediction errors than a classical implementation, even if training is performed over a small set of devices. The idea is to build different regression models for each specification during the training phase, and then to verify prediction consistency between the different models during the production testing phase. In case of divergent predictions, the devices are removed from the alternate test tier and directed to a second tier where further testing may apply. The approach is illustrated on a real case study that employs production test data from an RF power amplifier. Results show that, on the contrary to the classical implementation where prediction accuracy degrades when reducing the training set size, the proposed approach permits to preserve prediction accuracy independently of the training set size, while only a very small number of devices are directed to the second tier of the test flow.
Type de document :
Communication dans un congrès
ITC'2012: International Test Conference, Nov 2012, Anaheim, CA, United States. IEEE, pp.9, 2012, 〈10.1109/TEST.2012.6401560〉
Liste complète des métadonnées
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00803564
Contributeur : Florence Azais <>
Soumis le : vendredi 22 mars 2013 - 11:47:34
Dernière modification le : vendredi 20 juillet 2018 - 12:34:01

Identifiants

Collections

SYSMIC | LIRMM | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER

Citation

Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. Making predictive analog/RF alternate test strategy independent of training set size. ITC'2012: International Test Conference, Nov 2012, Anaheim, CA, United States. IEEE, pp.9, 2012, 〈10.1109/TEST.2012.6401560〉. 〈lirmm-00803564〉

Exporter

BibTeX TEI DC DCterms EndNote

Partager

Métriques

Consultations de la notice

242

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD