Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test Bench

Luigi Dilillo 1, * Paolo Rech 1 Jean-Marc Galliere 1 Patrick Girard 1 Frédéric Wrobel 2 Frédéric Saigné 2
* Auteur correspondant
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
2 IES - Institut d’Electronique et des Systèmes
Abstract : In this paper, we propose a technique for the detection of neutrons in atmospheric environment developed in the framework of HAMLET project. This technique relies on the sensitivity of SRAM cells to particle radiation. In particular, we introduce a system based on a memory test bench that records the neutron reactions in memory devices. This system presents a good rate of flexibility from different points of view. It is conceived to be modular, programmable, low power consuming and portable. The main novelty of the proposed test bench is its capability to run detection test with static (hold mode) and dynamic (operation) function. The test bench is independent of the type of memory, allowing the use and the study of the interaction between particles and electronic devices built with different technologies.
Mots-clés : Multiple Event Upset Soft Error Rate SRAM Core-cell Neutrons Single Event Upset
Type de document :
Communication dans un congrès
IEEE Latin American test Workshop, Mar 2011, Porto de Galinhas, Brazil. IEEE, pp.1-6, 2011, 〈https://www2.lirmm.fr/lirmm/interne/BIBLI/CDROM/MIC/2011/LATW_2011/panel.html〉
Liste complète des métadonnées
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00805120
Contributeur : Luigi Dilillo <>
Soumis le : mercredi 27 mars 2013 - 10:17:08
Dernière modification le : mercredi 30 mai 2018 - 09:34:04

Identifiants

  • HAL Id : lirmm-00805120, version 1

Collections

SYSMIC | LIRMM | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER | IES

Citation

Luigi Dilillo, Paolo Rech, Jean-Marc Galliere, Patrick Girard, Frédéric Wrobel, et al.. Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test Bench. IEEE Latin American test Workshop, Mar 2011, Porto de Galinhas, Brazil. IEEE, pp.1-6, 2011, 〈https://www2.lirmm.fr/lirmm/interne/BIBLI/CDROM/MIC/2011/LATW_2011/panel.html〉. 〈lirmm-00805120〉

Exporter

BibTeX TEI DC DCterms EndNote

Partager

Métriques

Consultations de la notice

143

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD